Emission and Laser Spectroscopy of Trapped Highly Charged Ions in Electron Beam 
Ion Traps

Crespo López-Urrutia, José Ramón; Harman, Zoltan

doi:10.1007/978-3-642-45201-7_10

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Emission and Laser Spectroscopy of Trapped Highly Charged Ions in Electron Beam Ion Traps

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Crespo López-Urrutia, José Ramón
Division Prof. Dr. Joachim H. Ullrich, MPI for Nuclear Physics, Max Planck Society;

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Harman, Zoltan
Division Prof. Dr. Christoph H. Keitel, MPI for Nuclear Physics, Max Planck Society;

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Citation

Crespo López-Urrutia, J. R., & Harman, Z. (2014). Emission and Laser Spectroscopy of Trapped Highly Charged Ions in Electron Beam Ion Traps. In W. Quint, & M. Vogel (Eds.), Fundamental Physics in Particle Traps (pp. 315-373). Berlin u.a.: Springer.

Cite as: http://hdl.handle.net/11858/00-001M-0000-0015-3A6E-A

Abstract

Research with highly charged ions addresses bound state quantum electrodynamics and relativistic atomic theory at their frontiers. Electron beam ion traps have provided practical means to study not only these fundamental fields, but also the physics of extremely hot plasmas in stars, active galactic nuclei, and fusion research plasma devices. Starting from the X-ray region, where the first experiments took place, this chapter will visit various regions of the electromagnetic spectrum and give a review of essential contributions of different groups to this field.