Negligible water surface charge determined using Kelvin probe and total 
reflection X-ray fluorescence techniques

Shapovalov, V. L.; Möhwald, H.; Konovalov, O. V.; Knecht, V.

doi:10.1039/c3cp51575c

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Negligible water surface charge determined using Kelvin probe and total reflection X-ray fluorescence techniques

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Shapovalov, V. L.
Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

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Möhwald, H.
Helmuth Möhwald, Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

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Knecht, V.
Theorie & Bio-Systeme, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

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Shapovalov, V. L., Möhwald, H., Konovalov, O. V., & Knecht, V. (2013). Negligible water surface charge determined using Kelvin probe and total reflection X-ray fluorescence techniques. Physical Chemistry Chemical Physics, 15(33), 13991-13998. doi:10.1039/c3cp51575c.

引用: https://hdl.handle.net/11858/00-001M-0000-0015-41DA-2

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