Basic properties of foam films stabilized with tetraethyl ammonium salt of 
perfluoro octane sulfonate (PFOS)

Ramanathan, M.; Müller, H. J.; Vedula, K.; Möhwald, H.; Krastev, R.

doi:10.1016/j.colsurfa.2009.11.032

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Basic properties of foam films stabilized with tetraethyl ammonium salt of perfluoro octane sulfonate (PFOS)

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Ramanathan, M.
Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

/persons/resource/persons121665

Müller, H. J.
Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

/persons/resource/persons121960

Vedula, K.
Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

/persons/resource/persons121654

Möhwald, H.
Helmuth Möhwald, Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

/persons/resource/persons121518

Krastev, R.
Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

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Ramanathan, M., Müller, H. J., Vedula, K., Möhwald, H., & Krastev, R. (2010). Basic properties of foam films stabilized with tetraethyl ammonium salt of perfluoro octane sulfonate (PFOS). Colloids and Surfaces A: Physicochemical and Engineering Aspects, 354(1-3 Sp. Iss.), 1-7. doi:10.1016/j.colsurfa.2009.11.032.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0015-4C67-0

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