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Multi-layer electron transfer across nanostructured Ag-SAM-Au-SAM junctions probed by surface enhanced Raman spectroscopy

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Shen,  Y. F.
Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

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Nakanishi,  T.
Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

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Möhwald,  H.
Helmuth Möhwald, Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

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Citation

Sezer, M., Feng, J. J., Ly, H. K., Shen, Y. F., Nakanishi, T., Kuhlmann, U., et al. (2010). Multi-layer electron transfer across nanostructured Ag-SAM-Au-SAM junctions probed by surface enhanced Raman spectroscopy. Physical Chemistry Chemical Physics, 12(33), 9822-9829. doi:10.1039/C003082A.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0015-4D8B-7
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