Measuring mechanical properties of polyelectrolyte multilayer thin films : 
novel methods based on AFM and optical techniques

Picart, C.; Senger, B.; Sengupta, K.; Dubreuil, F.; Fery, A.

doi:10.1016/j.colsurfa.2007.02.015

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Measuring mechanical properties of polyelectrolyte multilayer thin films : novel methods based on AFM and optical techniques

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Dubreuil, F.
Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

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Fery, A.
Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

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Picart, C., Senger, B., Sengupta, K., Dubreuil, F., & Fery, A. (2007). Measuring mechanical properties of polyelectrolyte multilayer thin films: novel methods based on AFM and optical techniques. Colloids and Surfaces A: Physicochemical and Engineering Aspects, 303(1-2), 30-36. doi:10.1016/j.colsurfa.2007.02.015.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0015-56B9-9

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