English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
Add to Basket
  Local TagsRelease HistoryDetailsSummary

Released
Journal Article

Ellipsometric light scattering for the characterization of thin layers on dispersed colloidal particles

MPS-Authors
/persons/resource/persons121263

Erbe,  A.
Kolloidchemie, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

/persons/resource/persons121928

Tauer,  K.
Klaus Tauer, Kolloidchemie, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

/persons/resource/persons121876

Sigel,  R.
Kolloidchemie, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Erbe, A., Tauer, K., & Sigel, R. (2006). Ellipsometric light scattering for the characterization of thin layers on dispersed colloidal particles. Physical Review E, 73(3): 031406. doi:10.1103/PhysRevE.73.031406.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0015-5B2C-0
Abstract
There is no abstract available