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Ellipsometric light scattering for the characterization of thin layers on dispersed colloidal particles

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Erbe,  A.
Kolloidchemie, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

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Tauer,  K.
Klaus Tauer, Kolloidchemie, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

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Sigel,  R.
Kolloidchemie, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

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Erbe, A., Tauer, K., & Sigel, R. (2006). Ellipsometric light scattering for the characterization of thin layers on dispersed colloidal particles. Physical Review E, 73(3): 031406. doi:10.1103/PhysRevE.73.031406.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0015-5B2C-0
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