Determination by x-ray reflectivity and small angle x-ray scattering of the 
porous properties of mesoporous silica thin films

Dourdain, S.; Bardeau, J. F.; Colas, M.; Smarsly, B.; Mehdi, A.; Ocko, B. M.; Gibaud, A.

doi:10.1063/1.1887821

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Determination by x-ray reflectivity and small angle x-ray scattering of the porous properties of mesoporous silica thin films

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Smarsly, B.
Kolloidchemie, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

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Dourdain, S., Bardeau, J. F., Colas, M., Smarsly, B., Mehdi, A., Ocko, B. M., et al. (2005). Determination by x-ray reflectivity and small angle x-ray scattering of the porous properties of mesoporous silica thin films. Applied Physics Letters, 86(11): 113108. doi:10.1063/1.1887821.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0015-5E00-1

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