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Determination by x-ray reflectivity and small angle x-ray scattering of the porous properties of mesoporous silica thin films

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Smarsly,  B.
Kolloidchemie, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

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Dourdain, S., Bardeau, J. F., Colas, M., Smarsly, B., Mehdi, A., Ocko, B. M., et al. (2005). Determination by x-ray reflectivity and small angle x-ray scattering of the porous properties of mesoporous silica thin films. Applied Physics Letters, 86(11): 113108. doi:10.1063/1.1887821.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0015-5E00-1
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