Smarsly, B. Kolloidchemie, Max Planck Institute of Colloids and Interfaces, Max Planck Society;
Dourdain, S., Bardeau, J. F., Colas, M., Smarsly, B., Mehdi, A., Ocko, B. M., & Gibaud, A. (2005). Determination by x-ray reflectivity and small angle x-ray scattering of the porous properties of mesoporous silica thin films. Applied Physics Letters, 86(11):. doi:10.1063/1.1887821.