X-ray reflectivity analysis of thin complex Langmuir-Blodgett films.

Poloucek, P.; Pietsch, U.; Geue, T.; Symietz, C.; Brezesinski, G.

doi:10.1088/0022-3727/34/4/302

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X-ray reflectivity analysis of thin complex Langmuir-Blodgett films.

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Symietz, C.
Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

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Brezesinski, G.
Gerald Brezesinski, Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

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Poloucek, P., Pietsch, U., Geue, T., Symietz, C., & Brezesinski, G. (2001). X-ray reflectivity analysis of thin complex Langmuir-Blodgett films. Journal of Physics D: Applied Physics, 34, 450-458. doi:10.1088/0022-3727/34/4/302.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0015-68D0-2

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