Microscopic ellipsometry: Imaging monolayer on arbitrary reflecting supports

Harke, M.; Stelzle, M.; Motschmann, H. R.

doi:10.1016/S0040-6090(95)08354-5

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Journal Article

Microscopic ellipsometry: Imaging monolayer on arbitrary reflecting supports

MPS-Authors

/persons/resource/persons121384

Harke, M.
Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

/persons/resource/persons121904

Stelzle, M.
Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

/persons/resource/persons121662

Motschmann, H. R.
Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Harke, M., Stelzle, M., & Motschmann, H. R. (1996). Microscopic ellipsometry: Imaging monolayer on arbitrary reflecting supports. Thin Solid Films, 284/285, 412-416. doi:10.1016/S0040-6090(95)08354-5.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0015-74B1-7

Abstract

There is no abstract available