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Microscopic ellipsometry: Imaging monolayer on arbitrary reflecting supports

MPS-Authors
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Harke,  M.
Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

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Stelzle,  M.
Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

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Motschmann,  H. R.
Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

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Harke, M., Stelzle, M., & Motschmann, H. R. (1996). Microscopic ellipsometry: Imaging monolayer on arbitrary reflecting supports. Thin Solid Films, 284/285, 412-416. doi:10.1016/S0040-6090(95)08354-5.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0015-74B1-7
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