Numerical analysis of x-ray reflectivity data from organic thin films at 
interfaces

Asmussen, A.; Riegler, H.

doi:10.1063/1.471492

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Journal Article

Numerical analysis of x-ray reflectivity data from organic thin films at interfaces

MPS-Authors

/persons/resource/persons121776

Riegler, H.
Hans Riegler, Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Asmussen, A., & Riegler, H. (1996). Numerical analysis of x-ray reflectivity data from organic thin films at interfaces. The Journal of Chemical Physics, 104(20), 8159-8164. doi:10.1063/1.471492.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0015-74C5-C

Abstract

There is no abstract available