English
 
User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Journal Article

Numerical analysis of x-ray reflectivity data from organic thin films at interfaces

MPS-Authors
/persons/resource/persons121776

Riegler,  H.
Hans Riegler, Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

External Ressource
No external resources are shared
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Asmussen, A., & Riegler, H. (1996). Numerical analysis of x-ray reflectivity data from organic thin films at interfaces. The Journal of Chemical Physics, 104(20), 8159-8164. doi:10.1063/1.471492.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0015-74C5-C
Abstract
There is no abstract available