X-ray reflectivity study of behenic acid Langmuir-Blodgett mono- and 
multilayers on SiO₂ surfaces as-deposited and after thermal treatment: 
Influence of substrate/film interactions on molecular ordering and film topology

Asmussen, A.; Riegler, H.

doi:10.1063/1.471491

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X-ray reflectivity study of behenic acid Langmuir-Blodgett mono- and multilayers on SiO₂ surfaces as-deposited and after thermal treatment: Influence of substrate/film interactions on molecular ordering and film topology

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Riegler, H.
Hans Riegler, Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

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Asmussen, A., & Riegler, H. (1996). X-ray reflectivity study of behenic acid Langmuir-Blodgett mono- and multilayers on SiO₂ surfaces as-deposited and after thermal treatment: Influence of substrate/film interactions on molecular ordering and film topology. The Journal of Chemical Physics, 104(20), 8151-8158. doi: 10.1063/1.471491.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0015-7516-0

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