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Reliable optical characterization of e-beam evaporated TiO2 films deposited at different substrate temperatures

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Amotchkina,  Tatiana V.
Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

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Trubetskov,  Michael K.
Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

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Angelov,  Ivan B.
Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

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Amotchkina, T. V., Trubetskov, M. K., Tikhonravov, A., Angelov, I. B., & Pervak, V. (2013). Reliable optical characterization of e-beam evaporated TiO2 films deposited at different substrate temperatures. Applied Optics, 53(4), A8-A15. doi:10.1364/AO.53.0000A8.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0018-E435-C
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