van Aken, P. A. Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;
El Bouayadi, R., Korytov, M., van Aken, P. A., Vennéguès, P., & Benaissa, M. (2014). Quantitative determination of compositional profiles using HAADF image simulations. Physica Status Solidi C, 11(2), 284-288. doi:10.1002/pssc.201300305.