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Quantitative determination of compositional profiles using HAADF image simulations

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van Aken,  P. A.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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El Bouayadi, R., Korytov, M., van Aken, P. A., Vennéguès, P., & Benaissa, M. (2014). Quantitative determination of compositional profiles using HAADF image simulations. Physica Status Solidi C, 11(2), 284-288. doi:10.1002/pssc.201300305.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0015-8CD8-0
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