A structural characterisation of the Co2FeZ (Z=Al, Si, Ga, Ge) Heusler 
compounds by x-ray diffraction and extended x-ray absorption fine structure 
spectroscopy

Balke, Balke; Wurmehl, Sabine; Fecher, Gerhard H.; Felser, Claudia; Alves, M. C. M.; Bernardi, Fabiano; Morais, Jonder

doi:10.1063/1.2731314

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A structural characterisation of the Co₂FeZ (Z=Al, Si, Ga, Ge) Heusler compounds by x-ray diffraction and extended x-ray absorption fine structure spectroscopy

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Citation

Balke, B., Wurmehl, S., Fecher, G. H., Felser, C., Alves, M. C. M., Bernardi, F., et al. (2007). A structural characterisation of the Co₂FeZ (Z=Al, Si, Ga, Ge) Heusler compounds by x-ray diffraction and extended x-ray absorption fine structure spectroscopy. Applied Physics Letters, 90(17): 172501, pp. 1-3. doi:10.1063/1.2731314.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0018-85B3-3

Abstract

This work reports on the structure of Fe containing, Co2-based Heusler compounds that are suitable for magnetoelectronic applications. The compounds Co2FeZ (where Z=Al, Si, Ga, and Ge) were investigated using the x-ray diffraction(XRD) and extended x-rayabsorption fine structure(EXAFS) techniques. Using XRD, it was shown conclusively that Co2FeAl crystallizes in the B2structure whereas Co2FeSi crystallizes in the L21structure. For compounds containing Ga or Ge, the XRD technique cannot be used to easily distinguish between the two structures. For this reason, the EXAFS technique was used to elucidate the structure of these two compounds. Analysis of the EXAFS data indicated that both compounds crystallize in the L21structure.