Conversion electron Mossbauer spectroscopy of epitaxial Co2Cr0.6Fe0.4Al thin 
films

Ksenofontov, Vadim; Herbort, Christian; Jourdan, Martin; Felser, Claudia

doi:10.1063/1.2952760

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Conversion electron Mossbauer spectroscopy of epitaxial Co₂Cr_0.6Fe_0.4Al thin films

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Ksenofontov, V., Herbort, C., Jourdan, M., & Felser, C. (2008). Conversion electron Mossbauer spectroscopy of epitaxial Co₂Cr_0.6Fe_0.4Al thin films. Applied Physics Letters, 92(26): 262501, pp. 1-3. doi:10.1063/1.2952760.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0018-8A5C-E

Abstract

Heusler half-metals are promising for spintronic applications. Epitaxial thin films of the exemplar compound Co(2)Cr(0.6)Fe(0.4)Al (CCFA) were investigated using conversion electron Mossbauer spectroscopy to clarify the factors influencing the spin polarization. CCFA films were deposited by rf magnetron sputtering on MgO substrates with and without an Fe buffer layer. Annealing improves their crystallographic order, causes the diffusion of Fe atoms from the Fe buffer layer into the CCFA, and favors the Co-Fe disorder. The listed factors are possible reasons for the increase and subsequent reduction of the tunneling magnetoresistance in CCFA thin films observable across the annealing temperature range. (C) 2008 American Institute of Physics.