Temperature dependence of stoichiometry of laser ablated YBa2Cu3O7−x thin films

Scott, K.; Mackenzie, A. P.; Dineen, C.; Phillips, W.A.

doi:10.1016/0921-4534(91)91116-L

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Temperature dependence of stoichiometry of laser ablated YBa₂Cu₃O_7−x thin films

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Scott, K., Mackenzie, A. P., Dineen, C., & Phillips, W. (1991). Temperature dependence of stoichiometry of laser ablated YBa₂Cu₃O_7−x thin films. Physica C-Superconductivity and its Applications, 185, 1983-1984. doi:10.1016/0921-4534(91)91116-L.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0018-E7E6-A

Abstract

Most of the analytical technique used in thin film research are insensitive to oxygen, and many are prone to thickness-dependent systematic errors. Electron Probe Microanalysis (EPMA) can give accurate analyses of thin films if sufficiently low accelerating voltages are used. We have used the technique to study whether fine stoichiometric changes are responsible for the quality differences that are observed in YBa2Cu3O7-x thin films produced at different substrate temperatures.