In-situ squared: multi property thin film measurements during straining

Cordill, M. J.; Glushko, O.; Kreith, J.; Marx, V. M.; Kirchlechner, C.; Zizak, I.; Struntz, T.; Fantner, E.

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In-situ squared: multi property thin film measurements during straining

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Cordill, M. J.
Max Planck Society;

Glushko, O.
Max Planck Society;

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Marx, V. M.
Structure and Micro-/Nanomechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Kirchlechner, C.
Nano-/Micromechanics of Materials, Structure and Micro-/Nanomechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Cordill, M. J., Glushko, O., Kreith, J., Marx, V. M., Kirchlechner, C., Zizak, I., et al. (2013). In-situ squared: multi property thin film measurements during straining. Talk presented at Nano- and Micromechanical Testing in Materials Research and Development IV. Olhão, Portugal. 2013-10-06 - 2013-10-11.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-210E-D

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