Dehm, Gerhard Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Dehm, G. (2013). Atomic resolution interface study of VN and Cu films on MgO using Cs corrected TEM. Talk presented at Microscopy Conference MC 2013. Regensburg, Germany. 2013-08-25 - 2013-08-30.