An Investigation of Thin Films Formed on Zinc by Spectroscopic Ellipsometry

Zuo, J.; Chen, Y.; Lin, C.-J.; Erbe, A.

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An Investigation of Thin Films Formed on Zinc by Spectroscopic Ellipsometry

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Erbe, A.
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Zuo, J., Chen, Y., Lin, C.-J., & Erbe, A. (2013). An Investigation of Thin Films Formed on Zinc by Spectroscopic Ellipsometry. Journal of Electrochemistry, 19(5), 409-417.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-2410-F

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