Investigation of Electrochemical Oxygen Reduction on Semiconductor Surfaces by 
Attenuated Total Internal Reflection Infrared Spectroscopy

Nayak, S.

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Investigation of Electrochemical Oxygen Reduction on Semiconductor Surfaces by Attenuated Total Internal Reflection Infrared Spectroscopy

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Nayak, S.
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Nayak, S. (2013). Investigation of Electrochemical Oxygen Reduction on Semiconductor Surfaces by Attenuated Total Internal Reflection Infrared Spectroscopy. PhD Thesis, Fakultät für Chemie und Biochemie, Ruhr-Universität Bochum, Bochum, Germany.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-2464-4

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