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Atom probe tomography for nanoscale analysis of nitride thin films

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Povstugar,  I.
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Choi,  P.
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Tytko,  D.
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Raabe,  D.
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Povstugar, I., Choi, P., Tytko, D., & Raabe, D. (2012). Atom probe tomography for nanoscale analysis of nitride thin films. Talk presented at 7th International Conference on Surfaces, Coatings and Nanostructured Materials NANOSMAT-2012. Prague, Chech Republic. 2012-09-18 - 2012-09-21.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0019-276B-B
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