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Attenuated Total Reflection Mid-IR-spectroscopy for Electrochemical Applications using a QCL

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Pengel,  S.
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Schönberger,  B.
Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Nayak,  S.
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Erbe,  A.
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Citation

Pengel, S., Schönberger, B., Nayak, S., & Erbe, A. (n.d.). Attenuated Total Reflection Mid-IR-spectroscopy for Electrochemical Applications using a QCL. In Lasers, Sources, and Related Photonic Devices Technical Digest. Optical Society of America, 2012.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-2BA9-5
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