English
 
User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Conference Paper

Attenuated Total Reflection Mid-IR-spectroscopy for Electrochemical Applications using a QCL

MPS-Authors
/persons/resource/persons125310

Pengel,  S.
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

/persons/resource/persons125379

Schönberger,  B.
Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

/persons/resource/persons125289

Nayak,  S.
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

/persons/resource/persons125132

Erbe,  A.
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

External Ressource
No external resources are shared
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Pengel, S., Schönberger, B., Nayak, S., & Erbe, A. (n.d.). Attenuated Total Reflection Mid-IR-spectroscopy for Electrochemical Applications using a QCL. In Lasers, Sources, and Related Photonic Devices Technical Digest. Optical Society of America, 2012.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0019-2BA9-5
Abstract
There is no abstract available