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Atom-Probe Tomography of compound semiconductors for photovoltaic and light-emitting device applications

MPS-Authors
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Choi,  P.
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Cojocaru-Mirédin,  O.
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Raabe,  D.
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Citation

Choi, P., Cojocaru-Mirédin, O., Abou-Ras, D., Caballero, R., Raabe, D., Smentkowski, V., et al. (2012). Atom-Probe Tomography of compound semiconductors for photovoltaic and light-emitting device applications. Microscopy Today, 20(3), 18-24.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0019-2CAF-F
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