Incidence angle dependence of enhancement factor in attenuated total reflection 
surface enhanced infrared absorption spectroscopy studied by numerical solution 
of the vectorial Maxwell equations

Vasan, G.; Erbe, A.

doi:10.1039/C2CP42603J

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Incidence angle dependence of enhancement factor in attenuated total reflection surface enhanced infrared absorption spectroscopy studied by numerical solution of the vectorial Maxwell equations

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Vasan, G.
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Erbe, A.
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Vasan, G., & Erbe, A. (2012). Incidence angle dependence of enhancement factor in attenuated total reflection surface enhanced infrared absorption spectroscopy studied by numerical solution of the vectorial Maxwell equations. Physical Chemistry Chemical Physics, 14, 14702-14709. doi:10.1039/C2CP42603J.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-2DD5-F

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