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Quantitative defect analysis using electron channeling contrast imaging under controlled diffraction conditions (cECCI)

MPS-Authors
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Elhami,  N.
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Tasan,  C. C.
Adaptive Structural Materials (Experiment), Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Zaefferer,  S.
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Citation

Elhami, N., Tasan, C. C., & Zaefferer, S. (2012). Quantitative defect analysis using electron channeling contrast imaging under controlled diffraction conditions (cECCI). In J. Shields, S. McKernan, L. Brewer, T. Ruiz, & D. Turnquist (Eds.), Proceedings of M&M 2012 (pp. 690-691). Microscopy Society of America.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0019-2DE5-B
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