English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Conference Paper

Quantitative defect analysis using electron channeling contrast imaging under controlled diffraction conditions (cECCI)

MPS-Authors
/persons/resource/persons125126

Elhami,  N.
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

/persons/resource/persons125421

Tasan,  C. C.
Adaptive Structural Materials (Experiment), Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

/persons/resource/persons125491

Zaefferer,  S.
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Elhami, N., Tasan, C. C., & Zaefferer, S. (2012). Quantitative defect analysis using electron channeling contrast imaging under controlled diffraction conditions (cECCI). In J. Shields, S. McKernan, L. Brewer, T. Ruiz, & D. Turnquist (Eds.), Proceedings of M&M 2012 (pp. 690-691). Microscopy Society of America.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0019-2DE5-B
Abstract
There is no abstract available