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Characterization of internal interfaces in Cu(In,Ga)Se2 thin-film solar cells using Atom Probe Tomography

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Cojocaru-Mirédin,  O.
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Choi,  P.
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Liu,  T.
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Raabe,  D.
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Cojocaru-Mirédin, O., Choi, P., Abou-Ras, D., Wuerz, R., Liu, T., Schmidt, S. S., et al. (2011). Characterization of internal interfaces in Cu(In,Ga)Se2 thin-film solar cells using Atom Probe Tomography. Talk presented at Euromat 2011. Montpellier, France. 2011-09-12 - 2011-09-15.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0019-2FDB-6
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