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In-situ ellipsometric monitoring of electrochemical preparation of ZnO nanoplates

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Chen,  Y.
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Schneider,  P.
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Erbe,  A.
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Chen, Y., Schneider, P., & Erbe, A. (2011). In-situ ellipsometric monitoring of electrochemical preparation of ZnO nanoplates. Talk presented at 62nd Annual Meeting of the International Society of Electrochemistry. Niigata, Japan. 2011-09-11 - 2011-09-16.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0019-3007-C
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