Integrated scanning kelvin probe-scanning electrochemical microscope system: 
Development and first applications

Maljusch, Artjom; Schönberger, Bernd; Lindner, Armin; Stratmann, Martin; Rohwerder, Michael; Schuhmann, Wolfgang

doi:10.1021/ac200953b

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Integrated scanning kelvin probe-scanning electrochemical microscope system: Development and first applications

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Schönberger, Bernd
Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Stratmann, Martin
Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Rohwerder, Michael
Christian Doppler Laboratory for Diffusion and Segregation Mechanisms, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Maljusch, A., Schönberger, B., Lindner, A., Stratmann, M., Rohwerder, M., & Schuhmann, W. (2011). Integrated scanning kelvin probe-scanning electrochemical microscope system: Development and first applications. Analytical Chemistry, 83(15), 6114-6120. doi:10.1021/ac200953b.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-3088-C

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