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Investigation of oxide growth on zinc by spectroscopic ellipsometry

MPS-Authors
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Chen,  Y.
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Schneider,  P.
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Erbe,  A.
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Citation

Chen, Y., Zuo, J., Schneider, P., & Erbe, A. (2011). Investigation of oxide growth on zinc by spectroscopic ellipsometry. Poster presented at ENFI 2011, Linz, Austria.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-30CA-7
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