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Electron diffraction-based techniques in the SEM: Do they give you everything you ever wanted to know about your sample?

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Zaefferer,  S.
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Zaefferer, S. (2011). Electron diffraction-based techniques in the SEM: Do they give you everything you ever wanted to know about your sample?. Talk presented at XIVth ICEM. Wisła, Poland. 2011-06-29.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0019-3136-9
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