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A new large-area mapping technique to improve the statistical reliability of EBSD datasets

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Davut,  K.
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Zaefferer,  S.
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Davut, K., & Zaefferer, S. (2011). A new large-area mapping technique to improve the statistical reliability of EBSD datasets. Talk presented at Royal Microscopy Society (RMS) EBSD 2011 Meeting. Düsseldorf, Germany. 2011-03-28 - 2011-03-30.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0019-3271-E
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