Treatment of Smearing in Ellipsometry

Sigel, R.; Erbe, A.

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Treatment of Smearing in Ellipsometry

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Erbe, A.
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Sigel, R., & Erbe, A. (2011). Treatment of Smearing in Ellipsometry. In Proceedings of the Workshop Nano Structures on Surfaces and Light Scattering (pp. 55-58).

Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-32FE-1

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