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Atomic force microscope imaging and force measurements at electrified and actively corroding interfaces: Challenges and novel cell design

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Valtiner,  M.
Christian Doppler Laboratory for Metal/Polymer Interfaces, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Ankah,  G. N.
Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Bashir,  A.
Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Renner,  F. U.
Interface Structures and High-Temperature Reactions, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Valtiner, M., Ankah, G. N., Bashir, A., & Renner, F. U. (2011). Atomic force microscope imaging and force measurements at electrified and actively corroding interfaces: Challenges and novel cell design. Review of Scientific Instruments, 82(2), 023703-1-023703-8. doi:10.1063/1.3541650.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0019-336F-E
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