Atomic force microscope imaging and force measurements at electrified and 
actively corroding interfaces: Challenges and novel cell design

Valtiner, M.; Ankah, G. N.; Bashir, A.; Renner, F. U.

doi:10.1063/1.3541650

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Atomic force microscope imaging and force measurements at electrified and actively corroding interfaces: Challenges and novel cell design

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Valtiner, M.
Christian Doppler Laboratory for Metal/Polymer Interfaces, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Ankah, G. N.
Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Bashir, A.
Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Renner, F. U.
Interface Structures and High-Temperature Reactions, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Valtiner, M., Ankah, G. N., Bashir, A., & Renner, F. U. (2011). Atomic force microscope imaging and force measurements at electrified and actively corroding interfaces: Challenges and novel cell design. Review of Scientific Instruments, 82(2), 023703-1-023703-8. doi:10.1063/1.3541650.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-336F-E

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