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A critical review of orientation microscopy techniques in SEM and TEM

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Zaefferer,  S.
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Zaefferer, S., & Wu, G. (2010). A critical review of orientation microscopy techniques in SEM and TEM. Talk presented at Facets of Electron Crystallography. Berlin, Germany. 2010-07-08.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0019-3813-3
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