Numerical simulation of probing the electric double layer by scanning 
electrochemical potential microscopy

Hamou, Fayçal Riad; Biedermann, Paul Ulrich; Erbe, Andreas; Rohwerder, Michael

doi:10.1016/j.electacta.2010.04.042

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Numerical simulation of probing the electric double layer by scanning electrochemical potential microscopy

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Hamou, Fayçal Riad
Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Biedermann, Paul Ulrich
Atomistic Modelling, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Erbe, Andreas
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Rohwerder, Michael
Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Hamou, F. R., Biedermann, P. U., Erbe, A., & Rohwerder, M. (2010). Numerical simulation of probing the electric double layer by scanning electrochemical potential microscopy. Electrochimica Acta, 55(18), 5210-5222. doi:10.1016/j.electacta.2010.04.042.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-38C0-0

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