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Numerical simulation of probing the electric double layer by scanning electrochemical potential microscopy

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Hamou,  Fayçal Riad
Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Biedermann,  Paul Ulrich
Atomistic Modelling, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Erbe,  Andreas
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Rohwerder,  Michael
Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Hamou, F. R., Biedermann, P. U., Erbe, A., & Rohwerder, M. (2010). Numerical simulation of probing the electric double layer by scanning electrochemical potential microscopy. Electrochimica Acta, 55(18), 5210-5222. doi:10.1016/j.electacta.2010.04.042.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0019-38C0-0
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