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Antireflective layers on thin metal films for mid‐infrared internal reflection spectroscopy

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Reithmeier,  M.
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

/persons/resource/persons125132

Erbe,  A.
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Citation

Reithmeier, M., & Erbe, A. (2010). Antireflective layers on thin metal films for mid‐infrared internal reflection spectroscopy. Poster presented at Optical Interference Coatings - Topical Meeting, Tucson, AZ, USA.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0019-38F8-3
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