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Dielectric interlayers increasing the transparency of metal films for mid-infrared attenuated total reflection spectroscopy

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Reithmeier,  M.
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Erbe,  A.
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Reithmeier, M., & Erbe, A. (2010). Dielectric interlayers increasing the transparency of metal films for mid-infrared attenuated total reflection spectroscopy. Physical Chemistry Chemical Physics, 12, 14798-14803. doi:10.1039/C0CP01125H.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0019-3C5F-E
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