English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Conference Paper

Antireflective Layers on Thin Metal Films for Mid-Infrared Internal Reflection Spectroscopy

MPS-Authors
/persons/resource/persons125341

Reithmeier,  M.
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

/persons/resource/persons125132

Erbe,  A.
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Reithmeier, M., & Erbe, A. (2010). Antireflective Layers on Thin Metal Films for Mid-Infrared Internal Reflection Spectroscopy. In Optical Interference Coatings (OIC) (pp. 1-3). Washington, D.C., USA: Optical Society of America (OSA).


Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-3C63-2
Abstract
There is no abstract available