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Journal Article

Application of SKP for in situ monitoring of ion mobility along insulator/insulator interfaces

MPS-Authors
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Rohwerder,  Michael
Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Isik-Uppenkamp,  Sonnur
Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Stratmann,  Martin
Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Rohwerder, M., Isik-Uppenkamp, S., & Stratmann, M. (2009). Application of SKP for in situ monitoring of ion mobility along insulator/insulator interfaces. Electrochimica Acta, 54(25), 6058-6062. doi:10.1016/j.electacta.2009.03.012.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-3E1A-7
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