Application of SKP for in situ monitoring of ion mobility along 
insulator/insulator interfaces

Rohwerder, Michael; Isik-Uppenkamp, Sonnur; Stratmann, Martin

doi:10.1016/j.electacta.2009.03.012

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Application of SKP for in situ monitoring of ion mobility along insulator/insulator interfaces

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Rohwerder, Michael
Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Isik-Uppenkamp, Sonnur
Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Stratmann, Martin
Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Rohwerder, M., Isik-Uppenkamp, S., & Stratmann, M. (2009). Application of SKP for in situ monitoring of ion mobility along insulator/insulator interfaces. Electrochimica Acta, 54(25), 6058-6062. doi:10.1016/j.electacta.2009.03.012.

引用: https://hdl.handle.net/11858/00-001M-0000-0019-3E1A-7

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