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What can EPR hyperfine parameters tell about the Si dangling bond? - A theoretical study

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Freysoldt,  C.
Defect Chemistry and Spectroscopy, Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Pfanner,  G.
Defect Chemistry and Spectroscopy, Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Neugebauer,  J.
Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Freysoldt, C., Pfanner, G., & Neugebauer, J. (2009). What can EPR hyperfine parameters tell about the Si dangling bond? - A theoretical study. Talk presented at International conference on amorphous and nanoporous semiconductors (ICANS) 23. Utrecht, Netherlands. 2009-08-24 - 2009-08-28.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0019-4008-9
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