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Simulation of probing the electric double layer by scanning electrochemical potential microscopy (SECPM)

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Hamou,  R. F.
Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Biedermann,  P. U.
Atomistic Modelling, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Erbe,  A.
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Rohwerder,  M.
Christian Doppler Laboratory for Diffusion and Segregation Mechanisms, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Hamou, R. F., Biedermann, P. U., Erbe, A., & Rohwerder, M. (2009). Simulation of probing the electric double layer by scanning electrochemical potential microscopy (SECPM). Talk presented at 11th International Fischer Symposium on Microscopy in Electrochemistry. Benediktbeuern, Germany. 2009-07 - 2009-07.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0019-4084-4
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