English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Talk

3D orientation microscopy by EBSD-FIB tomography: What can be done, what can't?

MPS-Authors
/persons/resource/persons125491

Zaefferer,  S.
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Zaefferer, S. (2009). 3D orientation microscopy by EBSD-FIB tomography: What can be done, what can't?. Talk presented at AGH - ZEISS Workshop on Focused Ion Beam techniques. Krakow, Poland. 2009-06-09.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-40BA-A
Abstract
There is no abstract available