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Advances in TEM orientation microscopy by combination of dark-field conical scanning and improved image matching

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Wu,  G.
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Zaefferer,  S.
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Wu, G., & Zaefferer, S. (2009). Advances in TEM orientation microscopy by combination of dark-field conical scanning and improved image matching. Ultramicroscopy, 109, 1317-1325.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-4475-4
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