Keil, P. Christian Doppler Laboratory for Metal/Polymer Interfaces, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Keil, P., & Lützenkirchen-Hecht, D. (2009). Surface-sensitive reflection-mode EXAFS from layered sample systems: The influence of surface and interface roughness. J. Synchrotron Rad., 16, 443-443.